Abstract

A novel near-field imaging system is proposed and simulated. It is seen that a significant improvement in performance in the presence of noise is possible without loss of resolution.

© 2005 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
Double diffractive optical element system for near-field shaping

Jose Maria Herrera-Fernandez and Luis Miguel Sanchez-Brea
Appl. Opt. 50(23) 4587-4593 (2011)

Subwavelength depth resolution in near-field microscopy

David G. Fischer
Opt. Lett. 25(20) 1529-1531 (2000)

Poled polymer thin-film gratings studied with far-field optical diffraction and second-harmonic near-field microscopy

R. D. Schaller, R. J. Saykally, Y. R. Shen, and F. Lagugné-Labarthet
Opt. Lett. 28(15) 1296-1298 (2003)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (3)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (7)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription