Abstract
The relative phase shifts of equal-slope interference fringes have been measured
on the two output images in a two-beam interferometer. Observations were made in the
visible region for twelve semitransparent layers composed of various metals. It is shown
that the difference of the relative shifts can be satisfactorily explained if it is
assumed that, depending on the phase of the interference, the absorption of a
semitransparent metallic layer varies from zero to twice its value. Based on this
assumption, a formula is obtained that connects the absorption of a semitransparent
metallic layer without interference and the relative shift of the interference fringes.
A comparison is made of the measured absorption of the semitransparent layers with the
values computed from this formula and the observed relative shifts. Comparison of the
measured shifts with the optical constants of the metals showed that the shift of the
fringes decreases as the refractive index of the metal from which the semitransparent
layer is fabricated increases. The practical application of these results is discussed.
© 2008 Optical Society of America
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