Abstract
The Mueller method is used to study the orientational order in multilayer polymeric films and their surface roughness. The films and their surfaces are modelled by an equivalent optical system consisting of sequential elements with linear and circular amplitude and phase anisotropy. The question of using Mueller-Jones matrices to find the parameters of polymeric films during their production is discussed.© 2004 Optical Society of America
PDF Article
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription