Characterization of Doped Silicon from 0.1 to 2.5 THz Using Multiple Reflection

Tae-In Jeon

Characterization of Doped Silicon from 0.1 to 2.5 THz Using Multiple Reflection

Tae-In Jeon

Journal of the Optical Society of Korea
Vol. 3,
Issue 1,
pp. 10-14
(1999)

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Tae-In Jeon, "Characterization of Doped Silicon from 0.1 to 2.5 THz Using Multiple Reflection," J. Opt. Soc. Korea 3, 10-14 (1999)

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About this Article
History
- Original Manuscript: January 12, 1999
- Published: March 1, 1999

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Abstract

Via THz Time domain spectroscopy, the characterization of high conductive n-type, 1.31Ω cm silicon can be measured by directly analyzing the multiple reflections using Fabry-Perot theory. The magnitude and phase difference of total transmission show good agreement between theoretical and experimental values over a 2.5 THz frequency range with complex index of refraction and power absorption. The measured absorption and dispersion are strongly frequency-dependent, and all of the results are well fit by a Cole-Davidson type distribution

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R.T. Kinsaewitz and B. Sentizky, J. Appl. Phys. 54, 3394 (1983)
[Crossref]
J.D. Holm and K.S. Champlin, J. Appl. Phys. 39, 275 (1968)
[Crossref]
T.-I. Jeon and D. Grischkowsky, Phys. Rev. Lett. 78, 1106 (1997)
[Crossref]
T.-I. Jeon and D. Grischkowsky, Appl. Phys. Lett. 72, 2259 (1998); 72, 3032 (1998)
[Crossref]
N. Katzenellenbogen and D. Grischkowsky, Appl. Phys. Lett. 58, 222 (1991)
[Crossref]
M van Exter, Ch. Fattinger, and D. Grischkowsky, Opt. Lett. 14, 1128, (1989)
[Crossref]
M. Born and E. Wolf, Principle of Optics, (Pergamon Press, Oxford, 1987)
T. Kihara and K. Yokomori, Appl. Opt. 29, 5069 (1990)
[Crossref]
T. Ohba and S. Ikawa, J. Appl. Phys. 64, 4141 (1988)
[Crossref]
D. Grischkowsky, S. Keiding, M van Exter, and Ch. Fattinger, J. Opt. Soc. Am. B 7, 2006 (1990)
[Crossref]
D.W. Davidson and RH. Cole, J. Chem. Phys. 19, 1484 (1951)
[Crossref]
S. Havriliak, Jr. and D.G. Watts, Polymer 27, 1509 (1986)
[Crossref]
K. Pathmanathan and J.R Stevens, J. Appl. Phys. 68, 5128 (1990)
[Crossref]
G.A. Niklasson, K. Brantervik, and L. Borjesson, J. Non-Cryst. Solids 131, 1096 (1991)
[Crossref]
M. van Exter and D. Grischkowsky, Phys. Rev. B 41, 12140 (1990)
[Crossref]

1998 (1)

T.-I. Jeon and D. Grischkowsky, Appl. Phys. Lett. 72, 2259 (1998); 72, 3032 (1998)
[Crossref]

1997 (1)

T.-I. Jeon and D. Grischkowsky, Phys. Rev. Lett. 78, 1106 (1997)
[Crossref]

1991 (2)

G.A. Niklasson, K. Brantervik, and L. Borjesson, J. Non-Cryst. Solids 131, 1096 (1991)
[Crossref]

N. Katzenellenbogen and D. Grischkowsky, Appl. Phys. Lett. 58, 222 (1991)
[Crossref]

1990 (4)

T. Kihara and K. Yokomori, Appl. Opt. 29, 5069 (1990)
[Crossref]

M. van Exter and D. Grischkowsky, Phys. Rev. B 41, 12140 (1990)
[Crossref]

K. Pathmanathan and J.R Stevens, J. Appl. Phys. 68, 5128 (1990)
[Crossref]

D. Grischkowsky, S. Keiding, M van Exter, and Ch. Fattinger, J. Opt. Soc. Am. B 7, 2006 (1990)
[Crossref]

1989 (1)

M van Exter, Ch. Fattinger, and D. Grischkowsky, Opt. Lett. 14, 1128, (1989)
[Crossref]

1988 (1)

T. Ohba and S. Ikawa, J. Appl. Phys. 64, 4141 (1988)
[Crossref]

1987 (1)

M. Born and E. Wolf, Principle of Optics, (Pergamon Press, Oxford, 1987)

1986 (1)

S. Havriliak, Jr. and D.G. Watts, Polymer 27, 1509 (1986)
[Crossref]

1983 (1)

R.T. Kinsaewitz and B. Sentizky, J. Appl. Phys. 54, 3394 (1983)
[Crossref]

1968 (1)

J.D. Holm and K.S. Champlin, J. Appl. Phys. 39, 275 (1968)
[Crossref]

1951 (1)

D.W. Davidson and RH. Cole, J. Chem. Phys. 19, 1484 (1951)
[Crossref]

Appl. Phys. Lett. (2)