Abstract
To account for and identify the effects of cryocontamination, the infrared complex refractive-index ( = n − ik) values of cryofilms of monomethyl hydrazine (MMH), hydrazine (N2H4), and nitrogen tetroxide (N2O4) were determined for the 500–3700-cm−1 wave-number range. We use techniques similar to those described in an earlier paper [ B. E. Wood and J. A. Roux, J. Opt. Soc. Am. 72, 720 ( 1982)] for thin H2O, CO2, and NH3 condensed-gas films. Thin MMH, N2O4, and N2H4 films from 0.25 to 9.0 μm thick were formed on a germanium substrate at 20 and 80 K in vacuum, and the infrared transmittances were measured by using a Fourier-transform spectrometer. Values of the optical properties (n, k) were derived from the experimental transmittance data by using a nonlinear least-squares method with a thin-film-transmittance analytical model. These optical constants were compared with results obtained with the subtractive Kramers–Kronig technique. These optical properties are important for predicting the performance of contaminated optical components.
© 1983 Optical Society of America
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