Abstract

An analysis that expands the resonant Voigt effect theory is presented. Elliptically polarized incident light interacts with atoms of a general Zeeman structure. The atoms are subjected to an externally applied transverse magnetic field. Light scattered in the forward direction is analyzed as to polarization. Under these conditions, light intensity transmitted by the polarization analyzer is calculated as a function of frequency and ellipticity of the incident light, atomic number density, and analyzer orientation. An experiment on forward scattering of circularly polarized light is also presented. This technique offers an alternative method of trace-element determination.

© 1979 Optical Society of America

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