Abstract

A new ellipsometric method based on the use of two azimuthal positions of the incident plane-polarized beam is described. The method can be used without a compensator and does not require accurate meaurement of the reflected light flux. The basic principle and practical feasibility of the method are discussed. A brief qualitative argument seems to indicate that the method may be useful for a wide range of values of tanψ and, if no compensator is used, for selected angles of incidence so that Δ is in the range 40°–60° (or, 120°–140°) or so. Some experimental results are also presented.

© 1972 Optical Society of America

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