Abstract

Previous measurements of high-intensity reciprocity failure (HIRF) and electron-microscopic examinations of development centers were extended by using a particular silver bromide dispersion in gelatin. The effects of various amounts of sulfur-sensitization (S) and various times of exposure were examined in detail. High amounts of S produced considerable HIRF which was diminished but not removed by latensification, whereas a low amount produced no HIRF. The distribution of development centers for high-intensity exposure was broader for high S than for low S. These results are interpreted in terms of the size and dispersity of the latent images. Various developer combinations are arranged qualitatively according to the minimum size necessary to induce development.

© 1966 Optical Society of America

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