Abstract
A new technique for analyzing the loss of high order modes in photonic
crystal VCSEL is reported. The technique proposed is a semi-empirical
approach that uses comparison to experimental data. For that purpose,
photonic crystal VCSEL devices of single mode and multi mode are fabricated
and measured for device characteristics comparison. The fabricated devices
are modeled using finite difference frequency domain technique for the
purpose of investigating the photonic crystal guided modes and loss
analysis. In order to verify the findings, full three dimensional analyses
are performed based on the fabricated single mode and multi mode devices
structures using common finite difference time domain technique. The results
show close agreement between the computed and experiment findings,
justifying the used of the proposed semi-empirical technique for analyzing
the loss of high order modes in photonic crystal VCSEL. Results for guided
modes and near- and far-field are also presented for the photonic crystal
VCSEL.
© 2010 IEEE
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