Abstract
Emergence of new fibers families induces considerable requirements in
terms of characterization and metrology (group delay, chromatic dispersion,
birefringence, bending losses, etc.). The optical low-coherence
reflectometry (OLCR) technique is demonstrated as a versatile method for the
characterization of most types of optical fiber. A synthesis of multiple
analysis concerning different families of specialty fibers including
rare-earth-doped fibers, few-mode fibers, and microstructured fibers will be
presented. OLCR allows measuring precisely the group velocity dispersion
value for both polarization modes and birefringence. It is also possible to
measure small refractive-index variations in a pumped Erbium-doped fiber.
Unique dispersive properties of higher order modes fiber offer novel
solutions for dispersion compensation or nonlinear effects management. OLCR
can allow each LP mode characterization without the requirement for mode
converters. A new method, called “time-wavelength reflection
mapping,” based on the OLCR interferogram processing is applied to
the determination of chromatic dispersion of each guided LP mode whatever
their group index. Finally, different characterization results concerning
photonics crystal fibers with guiding based on the conventional total
internal reflection principle (high-index guiding) or photonic bandgap
effect (low-index guiding) will be presented.
© 2009 IEEE
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