Abstract

Phase-error measurement using an incoherent light source and information in the resulting interferograms is an effective technique for characterizing waveguide-based optical devices. We propose a new analysis scheme that utilizes Hilbert transformation along with an increased data sampling rate of the interferogram. The higher data sampling rate makes the measurement more noise tolerant and improves the accuracy of the resulting phase determination to 0.2°. This technique enables a"windowing"analysis method that is capable of testing waveguides with very small path length differences. We also present a new analysis tool for device characterization by creating a"phase trend"plot that detects different optical modes propagating within the waveguide.

[IEEE ]

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription