Abstract

By coupling an infrared diode laser to a conventional infrared microscope, one achieves resolution approaching the diffraction limit while enabling rapid data collection. This technique is demonstrated with the use of a layered polymer sample that has been contaminated by migration of a volatile additive from an exogenous source. The distribution of this additive in the layered structure is shown to correlate with specific layers and reveals a concentration gradient suggesting a diffusive mechanism of additive migration parallel to the layered structure.

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