Abstract

An electrodeposition preconcentration technique was used in conjunction with total reflection x-ray fluorescence (TRXRF) analysis. Fnhancement in sensitivity on the order of 10³ was realized for the ions investigated here. In addition, x-ray scattering was reduced and a degree of selectivity was achieved by the electrodeposition. The results suggest that trace elemental analysis (sub-ppb level) with chemical speciation capability is feasible by using TRXRF with a conventional x-ray source.

Study on total reflection performance of films grown by atomic layer deposition relevant to X-ray reflective optics

Yanli Li, Weier Lu, Xinyue Zhang, Xiangdong Kong, Fei Qu, and Li Han
Appl. Opt. 61(14) 3934-3938 (2022)

Full-field X-ray fluorescence microscope based on total-reflection advanced Kirkpatrick–Baez mirror optics

Satoshi Matsuyama, Jumpei Yamada, Yoshiki Kohmura, Makina Yabashi, Tetsuya Ishikawa, and Kazuto Yamauchi
Opt. Express 27(13) 18318-18328 (2019)

Quantitative analysis of energy-dispersive X-ray fluorescence spectroscopy based on machine learning and a generative data enhancement technique

Wei Zhao, Xianyun Ai, and Hui Zhao
Appl. Opt. 62(36) 9476-9485 (2023)

Absorption effects on total-internal-reflection fluorescence spectroscopy

Minoru Toriumi, Masatoshi Yanagimachi, and Hiroshi Masuhara
Appl. Opt. 31(30) 6376-6382 (1992)

X-Ray Optics: The Production of Converging Beams by Total Reflection

W. Ehrenberg
J. Opt. Soc. Am. 39(9) 741-746 (1949)