Abstract

We present a formal Jones matrix analysis of a new far-infrared spectrometer design based on the Martin-Puplett interferometer. The new spectrometer utilizes double polarization modulation and eliminates problems due to source fluctuations, instrumental drift, and reduced dynamic range in studies of materials with small absorptivities. The spectrometer has successfully extended the reflection-absorption technique of thin-film spectroscopy into the far-infrared and millimeter wave region.

Martin-Puplett interferometer: an analysis

D. K. Lambert and P. L. Richards
Appl. Opt. 17(10) 1595-1602 (1978)

Folded-beam design for a Martin–Puplett interferometer with substrate polarizers

Donald E. Jennings
Appl. Opt. 35(16) 2910-2912 (1996)

Common-mode rejection in Martin–Puplett spectrometers for astronomical observations at millimeter wavelengths

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Development of a multi-Fourier-transform interferometer: fundamentals

Izumi S. Ohta, Makoto Hattori, and Hiroshi Matsuo
Appl. Opt. 45(12) 2576-2585 (2006)

Interferometric polarization control

David T. Chuss, Edward J. Wollack, S. Harvey Moseley, and Giles Novak
Appl. Opt. 45(21) 5107-5117 (2006)