Abstract

The use of wavelength modulation for background correction in graphite furnace atomic emission spectrometry is shown to improve detection limits in some cases by several orders of magnitude and to increase its applicability to sample analysis. An HGA-2100 graphite furnace atomizer is used in conjunction with a ¾-m monochromator equipped for wavelength modulation. A discussion of analytical growth curves, detection limits, scatter, and optimization of signal/noise ratio is presented. Copper is analyzed in botanical samples and the results are compared to analysis by atomic absorption and molecular absorption spectrophotometry.

Detection of trace amounts of Cr by two laser-based spectroscopic techniques: laser-enhanced ionization in flames and laser-induced fluorescence in graphite furnace

Ove Axner and Halina Rubinsztein-Dunlop
Appl. Opt. 32(6) 867-884 (1993)

Background signals in wavelength-modulation spectrometry by use of frequency-doubled diode-laser light. II. Experiment

Pawel Kluczynski, Åsa M. Lindberg, and Ove Axner
Appl. Opt. 40(6) 794-805 (2001)

Characterization of background signals in wavelength-modulation spectrometry in terms of a Fourier based theoretical formalism

Pawel Kluczynski, Åsa M. Lindberg, and Ove Axner
Appl. Opt. 40(6) 770-782 (2001)

Background signals in wavelength-modulation spectrometry with frequency-doubled diode-laser light. I. Theory

Pawel Kluczynski, Åsa M. Lindberg, and Ove Axner
Appl. Opt. 40(6) 783-793 (2001)

Theoretical description based on Fourier analysis of wavelength-modulation spectrometry in terms of analytical and background signals

Pawel Kluczynski and Ove Axner
Appl. Opt. 38(27) 5803-5815 (1999)