Abstract

A gaussian spectral line is represented as a true function of time and its power spectrum determined. With the use of this information and application of the sampling theorem, a relationship between system parameters such as spectral resolution, scan rate, amplifier band width, and sampling rate is established. Use of this relationship in establishing run parameters ensures acquisition of valid data by a digital sampling system.

Rapid-scanning terahertz precision spectrometer with more than 6 THz spectral coverage

G. Klatt, R. Gebs, C. Janke, T. Dekorsy, and A. Bartels
Opt. Express 17(25) 22847-22854 (2009)

A sampling theorem for space-variant systems

Robert J. Marks, John F. Walkup, and Marion O. Hagler
J. Opt. Soc. Am. 66(9) 918-921 (1976)

Characterization of digital dispersive spectrometers by low coherence interferometry

Ó. Martínez-Matos, C. Rickenstorff, S. Zamora, J.G. Izquierdo, and P. Vaveliuk
Opt. Express 25(4) 3222-3233 (2017)

Use of the AFCRL line parameters compilation to test the performance of an infrared spectrometer system

Y. S. Chang, J. H. Shaw, W. M. Uselman, and J. G. Calvert
Appl. Opt. 16(8) 2116-2118 (1977)

Basic angles in microelectromechanical system scanning grating spectrometers

Tino Puegner, Jens Knobbe, and Hubert Lakner
Appl. Opt. 50(24) 4894-4902 (2011)