Abstract

Surface analysis techniques such as ion scattering spectroscopy (ISS) and secondary ion mass spectroscopy (SIMS) use a beam of inert ions of approximately 0.5 to 3.0 ke V energy to slowly sputter away the surface of a solid material. The energy of the scattered ion is then measured (ISS) or the mass spectrum is recorded for the sputtered ionic species (SIMS) to provide an elemental profile analysis.

Nonoptical characterization of optical coatings

K. H. Guenther
Appl. Opt. 20(20) 3487-3502 (1981)

Non-invasive probing of dynamic ion migration in light-emitting electrochemical cells by an advanced nanoscale confocal microscope

Wei-Shiuan Tseng, Chi-Sheng Hsieh, Ming-Che Chan, and Hai-Ching Su
Opt. Express 30(16) 28817-28828 (2022)

Resonance ionization mass spectrometry of AlxGa₁₋xAs: depth resolution, sensitivity, and matrix effects

S. W. Downey, R. F. Kopf, E. F. Schubert, and J. M. Kuo
Appl. Opt. 29(33) 4938-4942 (1990)

Laser crater enhanced Raman spectroscopy

Vasily N. Lednev, Pavel A. Sdvizhenskii, Mikhail Ya. Grishin, Mikhail N. Filippov, Alexander N. Shchegolikhin, and Sergey M. Pershin
Opt. Lett. 42(3) 607-610 (2017)

Depth profiling analysis of CuIn_1-xGa_xSe₂ absorber layer by laser induced breakdown spectroscopy in atmospheric conditions

Chan Kyu Kim, Seok Hee Lee, Jung Hwan In, Hak Jae Lee, and Sungho Jeong
Opt. Express 21(S6) A1018-A1027 (2013)