X-ray Photoelectron Spectroscopic Studies of Valence States Produced by Ion-Sputtering Reduction

Lo I. Yin; Subrata Ghose; Isidore Adler

Applied Spectroscopy
Vol. 26,
Issue 3,
pp. 355-357
(1972)

X-ray Photoelectron Spectroscopic Studies of Valence States Produced by Ion-Sputtering Reduction

Lo I. Yin, Subrata Ghose, and Isidore Adler

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
Lo I. Yin, Subrata Ghose, and Isidore Adler, "X-ray Photoelectron Spectroscopic Studies of Valence States Produced by Ion-Sputtering Reduction," Appl. Spectrosc. 26, 355-357 (1972)

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Save article

Abstract

X-ray photoelectron spectroscopic measurements of various valence states of Fe and Cu in several compounds using ion-sputtering reduction are presented, and the potential usefulness of this time-dependent and in situ method is discussed.

PDF Article

More Like This

X-ray photoelectron spectroscopy study of thin TiO₂ films cosputtered with Al

Jin-Cherng Hsu, Paul W. Wang, and Cheng-Chung Lee
Appl. Opt. 45(18) 4303-4309 (2006)

Spectroscopic ellipsometry studies on various zinc oxide films deposited by ion beam sputtering at room temperature

Jin-Cherng Hsu, Yung-Hsin Lin, Paul W. Wang, and Yu-Yun Chen
Appl. Opt. 51(9) 1209-1215 (2012)

Electronic properties of undoped LiBaAlF₆ single crystals: far-ultraviolet optical, luminescence, and x-ray photoelectron spectroscopy studies

Vladimir A. Pustovarov, Igor N. Ogorodnikov, Sergey I. Omelkov, Dmitry A. Spassky, and Ludmila I. Isaenko
J. Opt. Soc. Am. B 31(8) 1926-1934 (2014)

Previous Article Next Article

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Abstract

Cited By

Applied Spectroscopy