Abstract

One of the most useful applications of internal reflection spectroscopy (ATR) is in microsampling. Not only can it be applied to the analysis of samples that are small in physical size such as a chip of paint or a small blemish on a surface, but it is a convenient and sensitive method for examining microsamples that can be spread over a considerable area. Examples are residues from the evaporation of solutions, condensed GC fractions, and thin coatings or weathered layers on surfaces. In this study we will discuss two different methods of internal reflection microsampling: (1) large plate, thin layer sampling and (2) condensed beam sampling.

Infrared characterization of surfaces and coatings by internal-reflection spectroscopy

E. D. Palik, J. W. Gibson, R. T. Holm, M. Hass, M. Braunstein, and B. Garcia
Appl. Opt. 17(11) 1776-1785 (1978)

Absorption effects on total-internal-reflection fluorescence spectroscopy

Minoru Toriumi, Masatoshi Yanagimachi, and Hiroshi Masuhara
Appl. Opt. 31(30) 6376-6382 (1992)

Internal Reflection Spectroscopy: Validity of Effective Thickness Equations

N. J. Harrick and A. I. Carlson
Appl. Opt. 10(1) 19-23 (1971)

Effective Thickness of Bulk Materials and of Thin Films for Internal Reflection Spectroscopy

N. J. Harrick and F. K. du Pré
Appl. Opt. 5(11) 1739-1743 (1966)

Procedures for Attenuated Total Reflection Study of Extremely Small Samples

Tomas Hirschfeld
Appl. Opt. 6(4) 715-718 (1967)