Abstract

Infrared spectroscopic methods have previously been developed for measuring the amount of structure and degree of orientation in three dimensions in polymer films. These methods involved tilting the sample with respect to the radiation beam. For samples with little orientation the results were found to be extremely sensitive to the accuracy of the absorbance measurements made at the tilted angle. This tilted absorbance measurement was required to determine the refractive index and path length of the refracted beam in the sample. The error in this sensitive measurement was reduced by utilizing a refractive index obtained from a multiple of measurements. The precision of the measurements was improved by 50% by this change in the method and suggests a simplification of the procedure. The improved method was utilized to study uniaxially drawn polyacrylonitrile films. It was concluded that only partial uniaxial orientation of the film was obtained.

Improvement of the interferometric method for measuring electro-optic coefficients of poled polymer thin films

Xin Yin, Qiwei Pan, Wei Shi, and Changshui Fang
Appl. Opt. 41(28) 5929-5932 (2002)

Method of improving optical poling efficiency in polymer films

Xiuqin Yu, Xiaoxia Zhong, Qu Li, Shouyu Luo, Yingli Chen, Yu Sui, and Jie Yin
Opt. Lett. 26(4) 220-222 (2001)

Zero-birefringence polymer by the anisotropic molecule dope method

Akihiro Tagaya, Shuichi Iwata, Eriko Kawanami, Hisashi Tsukahara, and Yasuhiro Koike
Appl. Opt. 40(22) 3677-3683 (2001)

Improved model-based infrared reflectrometry for measuring deep trench structures

Chuanwei Zhang, Shiyuan Liu, Tielin Shi, and Zirong Tang
J. Opt. Soc. Am. A 26(11) 2327-2335 (2009)

Improved attenuated-total-reflection technique for measuring the electro-optic coefficients of nonlinear optical polymers

Yi Jiang, Zhuangqi Cao, Qishun Shen, Xiaoming Dou, Yingli Chen, and Yukihiro Ozaki
J. Opt. Soc. Am. B 17(5) 805-808 (2000)