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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 22,
  • Issue 3,
  • pp. 212-213
  • (1968)

Low Temperature Far-Infrared Transmission Properties of Polycrystalline and Single-Crystal Silicon

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Abstract

Fateley <i>et al.</i> have reported that the far-infrared spectrum of polycrystalline silicon at room temperature has a 50% transmission curve from 30–500 cm<sup>−1</sup> We wish to report the appearance of three bands in similar material upon cooling to liquid-nitrogen temperature. A standard low-temperature cell was used for the measurements. A Beckman model IR-11 spectrophotometer and a Perkin–Elmer 521 spectrophotometer were used to record our data.

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