Correction of PZT scanner errors using a phase compensation method in white-light phase-shifting interferometry

Namyoon Kim and Soonyang Kwon

Appl. Opt. 60(30), 9311-9318 (2021)  View: HTML | PDF

Absolute measurement method for a spherical surface by random off-axis rotation based on Zernike polynomials

Pengfeng Sheng, Weicheng Gu, and Jun Yu

Appl. Opt. 60(30), 9333-9341 (2021)  View: HTML | PDF

Single sequence phase shifting spectrally resolved interferometry for an in-line thin film thickness measurement using spectral reflectance and phase

Yeongchan Cho, Seung Woo Lee, Sin Yong Lee, Garam Choi, and Heui Jae Pahk

Appl. Opt. 60(30), 9425-9431 (2021)  View: HTML | PDF

Development of point diffraction interferometer by a dimension-reduction-based phase-shifting algorithm

Leijie Feng, Hubing Du, Chang Liu, Jinlu Han, Gaopeng Zhang, Feng Wang, Zixin Zhao, and Fen Gao

Appl. Opt. 60(30), 9440-9446 (2021)  View: HTML | PDF

Global deblurring for continuous out-of-focus images using a depth-varying diffusion model

Yangjie Wei and Guochao Miao

Appl. Opt. 60(30), 9453-9465 (2021)  View: HTML | PDF