20 April 2018, Volume 57, Issue 12, pp. 2955-3328  
50 articles

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Film thickness measurement based on nonlinear phase analysis using a Linnik microscopic white-light spectral interferometer

Appl. Opt. 57(12), 2955-2961 (2018)  View: HTML | PDF

Temperature-dependent LITT effect in c axis inclined BiCuSeO thin films

Appl. Opt. 57(12), 3061-3064 (2018)  View: HTML | PDF