Abstract
To meet full-field image quality requirements for extremely low aberration optical systems, an initial structure construction method for reflective optical systems based on full-field aberration correction is proposed. The aberration of the full field is used as the main evaluation criterion in this method. A multi-field evaluation function is established using the aberration values of multiple characteristic field points to represent the full-field imaging quality, and spatial ray tracing is introduced to constrain the optical system structure. Multi-objective optimization of the evaluation function is performed using a combinatorial nondominated sorting and metaheuristics algorithm; an initial optical system with a reasonable structure and corrected third-order aberrations over the full field is subsequently obtained. After optimization, an extreme ultraviolet lithography objective with a numerical aperture of 0.33 and root-mean-square wavefront error of 0.128 nm ($1/105\lambda, \lambda = 13.5\;{\rm nm}$) is obtained.
© 2023 Optica Publishing Group
Full Article | PDF ArticleMore Like This
Yue Wu, Liping Wang, Jie Yu, Bo Yu, and Chunshui Jin
Appl. Opt. 59(32) 10185-10193 (2020)
Wei Tan, Huiru Ji, Yan Mo, and Donglin Ma
Appl. Opt. 61(29) 8633-8640 (2022)
Yue Wu, Liping Wang, Xu Zhang, Jie Yu, Bo Yu, and Chunshui Jin
Appl. Opt. 60(16) 4557-4566 (2021)