Abstract
We present an analysis of a spatial carrier-fringe pattern in three-dimensional (3-D) shape measurement by using the wavelet transform, a tool excelling for its multiresolution in the time- and space-frequency domains. To overcome the limitation of the Fourier transform, we introduce the Gabor wavelet to analyze the phase distributions of the spatial carrier-fringe pattern. The theory of wavelet transform profilometry, an accuracy check by means of a simulation, and an example of 3-D shape measurement are shown.
© 2004 Optical Society of America
Full Article | PDF ArticleMore Like This
Hanxiao Wang, Yinghao Miao, Hailu Yang, Zhoujing Ye, and Linbing Wang
Appl. Opt. 59(20) 6191-6202 (2020)
Sikun Li, Xianyu Su, and Wenjing Chen
Appl. Opt. 48(36) 6893-6906 (2009)
Min Zhong, Wenjing Chen, and Mohua Jiang
Appl. Opt. 51(5) 577-587 (2012)