Abstract

In two previous papers we presented experimental results of measurements with a scanning plasmon optical microscope constructed in the Kretschmann configuration. The angular distribution of the conical radiation from the scanning tip was measured, and the multiple-scattering images of simple surface irregularities were detected. We make a simple model of the multiple-scattering images and compare it with our data, deriving excellent results.

© 1998 Optical Society of America

Conical electromagnetic radiation in the Kretschmann attenuated total reflections configuration

Yung-Kyu Kim, P. R. Auvil, and J. B. Ketterson
Appl. Opt. 36(4) 841-846 (1997)

Model-based inversion of speckle interferometer fringe patterns

Douglas R. Schmitt and R. W. Hunt
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Microinterferometry: three-dimensional reconstruction of surface microtopography for thin-film and wetting studies by reflection interference contrast microscopy (RICM)

Gerald Wiegand, Klaus R. Neumaier, and Erich Sackmann
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Magnification of conic mirror reflectometers

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Modeling and experimental observation of an on-chip two-dimensional far-field interference pattern

Amir Hosseini, David Kwong, Yang Zhang, Andrea Alu, and Ray T. Chen
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