Abstract
Anumerical model was developed to emulate the capabilities of systems performing
noncontact absolute distance measurements. The model incorporates known methods
to minimize signal processing and digital sampling errors and evaluates the
accuracy limitations imposed by spectral peak isolation by using Hanning,
Blackman, and Gaussian windows in the fast Fourier transform technique. We
applied this model to the specific case of measuring the relative lengths of a
compound Michelson interferometer. By processing computer-simulated data through
our model, we project the ultimate precision for ideal data, and data containing
AM–FM noise. The precision is shown to be limited by nonlinearities in the laser
scan.
© 1996 Optical Society of America
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