Abstract

We experimentally investigate the birefringence of bare and coated substrates for magneto-optical recording, using ellipsometry at wavelengths of 632.8 and 780 nm. The polarization rotation and ellipticity of reflected or transmitted light are measured for different incident angles and for different orientations of the incident linear polarization. The measured data are then fitted by the multilayer computer program, which solves the Maxwell equations for a plane wave propagating in a multilayer structure. This approach makes it possible to determine, with high accuracy, the orientations of the principal axes of the substrate and the corresponding refractive indices. The results show that one of the principal axes is always along the substrate’s normal direction, but the orientations of the in-plane principal axes can be much different from the radial and track directions. A special feature of the ellipsometers that were used is that a glass hemisphere is placed in contact with the substrate to eliminate refraction of the incident beam. This enables a maximum propagation angle of 70° (with respect to the normal) in the substrate and hence increases the measurement sensitivity. Certain anomalies have been observed, which we believe are associated with the variation of birefringence properties along the thickness direction.

© 1994 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
Measuring distribution of the ellipsoid of birefringence through the thickness of optical disk substrates

Hong Fu, Satoshi Sugaya, and M. Mansuripur
Appl. Opt. 33(25) 5994-5998 (1994)

Retroreflecting ellipsometer for measuring the birefringence of optical disk substrates

Hong Fu, T. Goodman, S. Sugaya, J. K. Erwin, and M. Mansuripur
Appl. Opt. 34(1) 31-39 (1995)

Measurement of the wavelength dependence of birefringence for optical disk substrates

Hong Fu, Zheng Yan, and M. Mansuripur
Appl. Opt. 33(31) 7406-7411 (1994)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (15)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (1)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (8)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription