Abstract

A method of evaluating resistance to rubbing abrasion is described which is applicable to any optical surface, whereby surfaces of widely different optical properties can be compared. The depth of penetration of the abrasion marks is less than the thickness of many optical films so that properties of the film, rather than the substrate, are measured. After abrading, the surfaces are aluminized, and the light scattered from a reflected beam is collected over a complete hemisphere by a novel design of hazemeter. Results of measurement on films of Cr, MgF2, and SiO as well as on plate glass and two transparent plastics are presented.

© 1964 Optical Society of America

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