Abstract

We have designed and tested a simple instrument to measure the diffuse reflectance of good quality optical surfaces such as the surfaces of semiconductor detectors with uncertainties of ~3%. Measurements have been performed on Si photodiodes and on a sample of known reflectance at two different wavelengths.

© 1990 Optical Society of America

Full Article  |  PDF Article
More Like This
Longterm changes of silicon photodiodes and their use for photometric standardization

George Eppeldauer
Appl. Opt. 29(15) 2289-2294 (1990)

Characterization and calibration of a variable-angle absolute reflectometer

Carlo Castellini, Gabriele Emiliani, Enrico Masetti, Pasquale Poggi, and P. Pietro Polato
Appl. Opt. 29(4) 538-543 (1990)

Comparison of two cryogenic radiometers by determining the absolute spectral responsivity of silicon photodiodes with an uncertainty of 0.02%

Nigel P. Fox and John E. Martin
Appl. Opt. 29(31) 4686-4693 (1990)

View More...

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (7)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (2)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (7)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription