Abstract

We have designed and tested a simple instrument to measure the diffuse reflectance of good quality optical surfaces such as the surfaces of semiconductor detectors with uncertainties of ~3%. Measurements have been performed on Si photodiodes and on a sample of known reflectance at two different wavelengths.

© 1990 Optical Society of America

Longterm changes of silicon photodiodes and their use for photometric standardization

George Eppeldauer
Appl. Opt. 29(15) 2289-2294 (1990)

Characterization and calibration of a variable-angle absolute reflectometer

Carlo Castellini, Gabriele Emiliani, Enrico Masetti, Pasquale Poggi, and P. Pietro Polato
Appl. Opt. 29(4) 538-543 (1990)

Comparison of two cryogenic radiometers by determining the absolute spectral responsivity of silicon photodiodes with an uncertainty of 0.02%

Nigel P. Fox and John E. Martin
Appl. Opt. 29(31) 4686-4693 (1990)

NBS specular reflectometer–spectrophotometer

Victor R. Weidner and Jack J. Hsia
Appl. Opt. 19(8) 1268-1273 (1980)

Temperature dependent nonlinearity effects of a QED-200 detector in the visible

Rainer Köhler, Roger Pello, and Jacques Bonhoure
Appl. Opt. 29(28) 4212-4215 (1990)