Reflectance diagram-aided technique for optical coating design and monitoring

Abstract

An amplitude reflectance diagram is a useful tool for visualizing the relationships between the performance of an optical coating and the optical parameters. This paper gives a brief description of the construction and characterization of the reflectance diagrams for different indices. Then, applications of reflectance diagram-aided techniques to the design of both phase dispersion-induced narrow reflection and transmission filters, as well as to the optical monitoring of the symmetric multilayers of types (A2BA) and (AB2CBA), are illustrated. Some experimental results of phase dispersion-induced narrowband filters are reported.

© 1989 Optical Society of America

Circle diagrams applied to the design of thin film optical tunnel filters

Gary L. Scheidegger
Appl. Opt. 28(11) 2061-2069 (1989)

Wideband monitoring and measuring system for optical coatings

Li Li and Yi-hsun Yen
Appl. Opt. 28(14) 2889-2894 (1989)

Graphics in Optical Coating Design

Joseph H. Apfel
Appl. Opt. 11(6) 1303-1312 (1972)

Research on thin film anticounterfeiting coatings at the National Research Council of Canada

J. A. Dobrowolski, F. C. Ho, and A. Waldorf
Appl. Opt. 28(14) 2702-2717 (1989)

Apparatus for wideband monitoring of optical coatings and its uses

Xue-Qun Hu, Yu-Ming Chen, and Jin-Fa Tang
Appl. Opt. 28(14) 2886-2888 (1989)