Abstract
Experience shows that optical and radio reflector surfaces may have systematic residual deviations to which the statistical analysis is not necessarily applicable. For large-scale systematic deviations we derive a general expression for calculating the degraded on-axis intensity, i.e., the Strehl number. For this type of deviation we introduce a quasi-rms value, which has the same optical significance as the rms value of random surface deviations. Numerical examples of realistic cases are presented.
© 1980 Optical Society of America
Full Article | PDF ArticleMore Like This
J. Bescos, I. Glaser, and A. A. Sawchuk
Appl. Opt. 19(22) 3869-3876 (1980)
George C. Valley
Appl. Opt. 19(4) 574-577 (1980)
Paul E. Klingsporn
Appl. Opt. 19(9) 1435-1438 (1980)