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Tilted-Reference-Beam Lateral Shearing Interferometer Utilizing Carrier-Frequency Photography

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Abstract

Double-exposure carrier-frequency photography where the grating is rotated between exposures is used for observing phase objects. The resulting interferogram is similar to those obtained from interferometers using a tilted reference beam. Positive and negative gradients of the phase variation can be distinguished. Furthermore, it is shown that the image of a grating in carrier-frequency photography can be achieved by using an image-forming lens or by using the self-imaging property of the grating.

© 1975 Optical Society of America

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