Abstract

By placing a thin layer of a metal with plasma frequency ω_p upon a substrate of a second metal with a plasma frequency much greater than ω_p a configuration is created that greatly enhances plasma-resonance effects upon reflectance. Sample results of calculations for films of potassium and silver deposited upon an aluminum substrate are presented. The results suggest that reflectance measurements with such composite samples may provide new information on solid-state plasma resonances as well as provide a simulation for other interactions of electromagnetic radiation with bounded plasmas.

© 1973 Optical Society of America

Effect of Atmospheric Exposure on the Infrared Reflectance of Silvered Mirrors With and Without Protective Coatings

D. K. Burge, H. E. Bennett, and E. J. Ashley
Appl. Opt. 12(1) 42-47 (1973)

Surface Film Thickness Determination by Reflectance Measurements

D. T. Larson, L. A. Lott, and D. L. Cash
Appl. Opt. 12(6) 1271-1275 (1973)

Wavelength Bandwidth and Other Design Aspects for Film–Substrate Reflection Polarizers

M. Ruiz-Urbieta, E. M. Sparrow, and G. W. Goldman
Appl. Opt. 12(3) 590-596 (1973)

Total-Reflection Liquid-Crystal Electrooptic Device

R. A. Kashnow and C. R. Stein
Appl. Opt. 12(10) 2309-2311 (1973)

Irradiance Reflectivity of a Flat Ocean as a Function of Its Optical Properties

Howard R. Gordon and Otis B. Brown
Appl. Opt. 12(7) 1549-1551 (1973)