Author Affiliations

Shun Notte,¹ Sota Hashimoto,¹ Tomoyoshi Inoue,^1,2 Kenzo Nishio,³ Peng Xia,⁴ Sudheesh K. Rajput,¹ Osamu Matoba,⁵ and Yasuhiro Awatsuji^6,*

¹Graduate School of Science and Technology, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan

²Japan Society for the Promotion of Science, Kojimachi Business Center Building, 5-3-1 Kojimachi, Chiyoda-ku, Tokyo 102-0083, Japan

³Advanced Technology Center, Kyoto Institute of Technology, Matsugasaki Goshokaido-Cho, Sakyo-ku, Kyoto 606-8585, Japan

⁴National Institute of Advanced Industrial Science and Technology (AIST), Central 2, 1-1-1 Umezono, Tsukuba 305-8568, Japan

⁵Kobe University, Organization for Advanced and Integrated Research, Rokkodai 1-1, Nada, Kobe 657-850, Japan

⁶Faculty of Electrical Engineering and Electronics, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto, 606-8585, Japan

^*Corresponding author: awatsuji@kit.ac.jp