Abstract
We describe a simple, self-aligned confocal transmission microscopy technique based on two-photon-induced photocurrents of silicon photodiodes. Silicon detectors produce photocurrents in quadratic dependence on incident intensity under the pulsed illumination of light with wavelengths longer than . We exploit this nonlinear process to reject out-of-focus background and perform depth-sectioning microscopic imaging. We demonstrate a comparable background rejection capability of the technique to linear confocal detection and present three-dimensional imaging in biological specimens.
© 2009 Optical Society of America
Full Article | PDF ArticleMore Like This
Daryl Lim, Kengyeh K. Chu, and Jerome Mertz
Opt. Lett. 33(12) 1345-1347 (2008)
Kengyeh K. Chu, Ran Yi, and Jerome Mertz
Opt. Express 15(5) 2476-2489 (2007)
C. Yang and J. Mertz
Opt. Lett. 28(4) 224-226 (2003)