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  • The Thirteenth International Conference on Ultrafast Phenomena
  • 2002 OSA Technical Digest Series (Optica Publishing Group, 2002),
  • paper PD3
  • https://doi.org/10.1364/UP.2002.PD3

Electro-optic Detection of Sub-Wavelength THz Spot Sizes in the Near-Field of a Metal Tip

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Abstract

There is currently a strong interest to improve the spatial resolution in THz time-domain imaging for THz microscopy of single cells. To date, work on improving the resolution was based on the use of an aperture[1] or a dynamic aperture[2], to limit the THz spotsize. Apertures, however, block the longer wavelength components of the THz pulse and/or require microfabrication techniques to make them. Here, we present a new and simple method to obtain a sub-wavelength resolution in THz-TDS, in which we measure only the distorted electric-field component of a THz pulse, in the near field of a sharp metal tip. The setup is shown in Fig. 1.

© 2002 Optical Society of America

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