Differential time-domain THz spectroscopy for dielectric measurement of µm-thick films

Zhiping Jiang; Ming Li; X.-C. Zhang

doi:10.1364/UP.2000.MF30

Ultrafast Phenomena
OSA Trends in Optics and Photonics (Optica Publishing Group, 2000),
paper MF30
•https://doi.org/10.1364/UP.2000.MF30

Differential time-domain THz spectroscopy for dielectric measurement of µm-thick films

Zhiping Jiang, Ming Li, and X.-C. Zhang

International Conference on Ultrafast Phenomena 2000

Charleston, South Carolina United States
ISBN: 1-55752-640-0

From the session
Poster Session 1 (MF)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
Z. Jiang, M. Li, and X. -. Zhang, "Differential time-domain THz spectroscopy for dielectric measurement of µm-thick films," in Ultrafast Phenomena, T. Li, ed., Vol. 43 of OSA Trends in Optics and Photonics (Optica Publishing Group, 2000), paper MF30.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

Differential time-domain spectroscopy provides dielectric constant measurement of µm films in GHz to THz frequency range. We present a theoretical model and demonstrate preliminary experimental results.

PDF Article

More Like This

THz absorption spectrum of explosive material 2,4-DNT obtained by THz differential time domain spectroscopy

Haibo Liu, Yunqing Chen, Caterina Soldano, Dunja Schauki, Michael J. Fitch, Robert Osiander, and X.-C. Zhang
FTuG29 Frontiers in Optics (FiO) 2004

Characterization of porous silicon using Terahertz differential time-domain spectroscopy

Suchitra Ramani, Alan Cheville, J. Escorcia Garcia, and Vivechana Agarwal
TuA5 Optical Terahertz Science and Technology (OTST) 2007

Time-Domain Spectroscopy with Fsec Pulses of THz Radiation

D. Grischkowsky
TuC2 Nonlinear Optics (NLO) 1992

Previous Article Next Article