Abstract
Recently there has been much interest in broadband spectroscopy techniques based on optically generated ultrashort electromagnetic pulses.1-3 Auston et. al. used Cherenkov-like radiation produced by optical rectification in non-linear crystals to perform contact reflection measurements.1 We have demonstrated the Coherent Microwave Transient Spectroscopy (COMITS) technique to measure the complex dielectric properties of materials in the 15-130 GHz range.2 More recently this technique has been extended to higher frequencies by Grischkowsky et. al.3 Here we present results of broadband microwave reflection spectroscopy with optoelectronically generated, freely propagating, picosecond transient radiation. The technique is illustrated with the measured complex reflection function of Fabry-Perot interferometers, the dispersion from amplitude gratings, and reflection from materials. The experimental results are compared with theory and in all cases very good agreement is found.
© 1990 Optical Society of America
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