Monitoring the back-scattered light from a microsphere, acting as a low-Q concentric cavity interferometer, enables non-contact, in-situ measurement of diameter variations. The interferometric technique is used for improving ellipticity during microsphere fabrication and characterization.

© 2020 The Author(s)

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription