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Conferences > QO > 1995 > QWA > QWA3

Quantum Mechanical Capacitance in a Scanning Tunneling Microscope

D. Botkin, S. Weiss, D.F. Ogletree, M. Salmeron, and D.S. Chemla

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Abstract

One of the most spectacular manifestations of quantum mechanics is tunneling between closely spaced conductors. The DC I-V characteristics in different types of tunnel junctions, such as metal-vacuum-metal junctions (MVM), metal-insulator-metal junctions (MIM), Josephson junctions, and quantum point contacts in a two dimensional electron gas, are well understood. High frequency transport in these systems is much less understood, and has been the subject of intense research in recent years[1,2].

© 1995 Optical Society of America

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