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Si/B4C Soft X-Ray Multilayer Mirrors

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Abstract

In previous work we have identified the Si/B material pair as useful for narrow bandpass optics at wavelengths above the Si L-edge, λ>124 Å.1,2 Unfortunately, useful boron sputtering targets are not generally available. However, excellent B4C targets are readily available, and the theoretical reflectivities of Si/B4C multilayers are only slightly less than for Si/B. In this wavelength region Si is the spacer and B4C is the absorber-thus breaking the standard rule of thumb, that good spacer/absorber pairs are low/high atomic number. Although the optical constants of B4C do not have strong contrast with Si, like those of Mo for example, the low absorption allows more interfaces to contribute to the reflection. Theoretical normal-incidence reflectivities calculated for ideal structures start at approximately 65% near the Si L-edge and drop with increasing λ to ~31% at 250 Å, compared to 77% and 37% for Si/Mo. Although the reflectivity is lower for Si/B4C, having more interfaces contribute results in narrow bandpass mirrors that are more desirable for several applications.

© 1994 Optical Society of America

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