Abstract

The technique of picosecond electro-optic sampling for time-resolving ultrafast electrical transients is presently the only means by which an electrical waveform can be measured with single picosecond resolution. In addition, the electro-optic sampling oscilloscope is capable of millivolt sensitivity and can be used in a contactless configuration, a feature that will enable the rapid characterization of packaged electronic circuits or 2-dimensionai mapping of electric fields. The major drawback of the electro-optic sampling oscilloscope is that it requires a short pulse laser system. The complexity of such a laser system results in a sampling oscilloscope that is delicate, maintenance intensive, and expensive, precluding its development in all but a few large laboratories.

© 1985 Optical Society of America