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Conferences > OSE > 2010 > SWD > SWD3

Evaluation of the Quality Factor of microcrystalline thin-film solar cell

Sheng-Hui Chen, Ting-Wei Chang, Yi-Chan Chen, and Yu-Hung Chen

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Abstract

By dividing the absorption coefficient at 1.4eV with the value at 0.9eV, we could judge the quality of μc-Si:H and predict (Voc*Isc) of solar cell when using this layer as its intrinsic layer.

© 2010 Optical Society of America

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