A Method for Determining Dielectric Losses of Thin Films

R. Lalezari; M. Kriewaldt; D. Long

doi:10.1364/OIC.1992.OThD7

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1992),
paper OThD7
•https://doi.org/10.1364/OIC.1992.OThD7

A Method for Determining Dielectric Losses of Thin Films

R. Lalezari, M. Kriewaldt, and D. Long

Optical Interference Coatings 1992

Tucson, Arizona United States
1–5 June 1992
ISBN:

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Optical Characterization (OThD)

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R. Lalezari, M. Kriewaldt, and D. Long, "A Method for Determining Dielectric Losses of Thin Films," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1992), paper OThD7.

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Abstract

Changes in the reflectivity of ultra low loss mirrors, after overcoating with evaporated dielectric films, can be used to determine the losses of those films.

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