Abstract

In view of persistent difficulties in relating observations of radiation scattered from optical coatings to predictions of relevant physical models embodying measurable parameters of the interfacial roughnesses, there have recently been re-appraisals,^1,2 of these models. In particular, the limitations of diffraction theory have been re-emphasised in relation to the evaluation of total integrated scatter (TIS)^3,4 attributable to rough layer boundaries.

© 1984 Optical Society of America