Abstract

Spectrophotometric, attenuation and compensation techniques were used for measurements of retardance in crystal quartz waveplates. The repeatability of compensation measurements is better than λ/2,000 for two wavelengths, 0.6328 and 1.0641 μm. This has been achieved by excluding multireflection images, precise orientation of all polarization components, fine adjustment and uniform irradiation of the optical elements of this dual wavelength, double channel measurement setup.

© 1992 Optical Society of America