10.6 Micron Wavelength BRDF Measurement on Low Reflectance A1 Samples

James P. Reilly; Lorraine E. Kaczor; Thomas A. Leonard

doi:10.1364/OFT.1990.OThC4

Optical Fabrication and Testing
Technical Digest Series (Optica Publishing Group, 1990),
paper OThC4
•https://doi.org/10.1364/OFT.1990.OThC4

10.6 Micron Wavelength BRDF Measurement on Low Reflectance A1 Samples

James P. Reilly, Lorraine E. Kaczor, and Thomas A. Leonard

Optical Fabrication and Testing 1990

Monterey, California United States
12–14 June 1990
ISBN:

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Angle-Resolved Scatter Measurements (OThC)

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J. P. Reilly, L. E. Kaczor, and T. A. Leonard, "10.6 Micron Wavelength BRDF Measurement on Low Reflectance A1 Samples," in Optical Fabrication and Testing, Technical Digest Series (Optica Publishing Group, 1990), paper OThC4.

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Abstract

BRDF measurements made using a 10.6 wavelength laser on low reflectance, diffuse Al samples, showed the BRDF was spatially uniform and smoothly varying with scatter angle.

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