Optical Recording in Amorphous Hydrogenated Tellurium

L.M. Schiavone; M.A. Bösch; H.R. Haller; W.E. Hubbard; E. Good; J.L. Shay

doi:10.1364/ODS.1984.ThCA2

Topical Meeting on Optical Data Storage
Technical Digest Series (Optica Publishing Group, 1984),
paper ThCA2
•https://doi.org/10.1364/ODS.1984.ThCA2

Optical Recording in Amorphous Hydrogenated Tellurium

L.M. Schiavone, M.A. Bösch, H.R. Haller, W.E. Hubbard, E. Good, and J.L. Shay

Optical Data Storage 1984

Monterey, California United States
18–20 April 1984
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L. M. Schiavone, M. A. Bösch, H. R. Haller, W. E. Hubbard, E. Good, and J. L. Shay, "Optical Recording in Amorphous Hydrogenated Tellurium," in Topical Meeting on Optical Data Storage, Technical Digest Series (Optica Publishing Group, 1984), paper ThCA2.

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Abstract

The optical writing characteristics of sputtered tellurium films are presented. We compare thin films sputtered in argon to those sputtered in an argon-hydrogen mixture. Preliminary stress tests are described.

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