Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Dispersion characterization of optical materials with white light interferometry

Open Access Open Access

Abstract

A simple Michelson interferometer with an inexpensive white light source (halogen lamp) can be used to completely determine the dispersion characteristics of optical materials (glass or mirror) when the material is placed in the stationary arm of the interferometer and the other arm is lengthened by means of a motor-driven screw. The Fourier transform of the digitally sampled interference pattern gives the necessary phase information, which can be used to determine the group velocity, group velocity dispersion, and even higher order terms. Simultaneous recording of a He–Ne laser passing through the same interferometer is needed to monitor the optical path.

© 1992 Optical Society of America

PDF Article
More Like This
Dispersion measurements of optical materials using white light interferometry

A.G. Van Engen, S.A. Diddams, and T.S. Clement
CWA8 Conference on Lasers and Electro-Optics (CLEO:S&I) 1998

Acoustically Scanned Delay For White-Light Interferometry

Erling Kolltveit and Kjell Bløtekjær
P29 Optical Fiber Sensors (OFS) 1992

Attosecond measurement of fiber-optic chromatic dispersion by white-light interferometry

Valeria Gusmeroli and Mario Martinelli
WP11 Optical Fiber Communication Conference (OFC) 1995

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.